Using SWIR-based Camera Systems for Laser Beam Profiling

Systems based on cameras are considered to be the standard used for laser beam profiles using pulsed light. These cameras are used to measure and monitor the beam’s length. The applications of these systems are numerous and varied. Read on to discover the benefits of SWIR camera-based laser systems that use SWIR cameras for beam profiling.

The advantages of silicon-based Optical Systems

Silicon-based charge-coupled devices and silicon-based complementary metal-oxide-semiconductors (e.g. CCDs or CMOS) are commonly used in high-performance imaging and can detect wavelengths that extend from soft x-rays into near-infrared (NIR). In general the quantum efficacy of CCDs is reduced as the detection wavelength expands to that NIR range. In wavelengths that exceed 1100 nm, with conventional CCDs and CMOS system light is not absorbent by a silicon-based crystal as the photons in that quality of light don’t have sufficient energy to cause the electron to leap.

The latter type features large area sensors with the highest resolution. It is essential for precise measurements of both small and massive laser beams. The two types of profilers are able to measure the wavelengths that range from UV up to the near infrared (IR). 

SWIR Vision Systems has a proprietary camera line for laser beam profiling with an 800 to 1,700 nm sensor band range built on colloidal quantum dots (CQD) – thin film photodiodes made in a single piece made from readout quartz wafers. They are able to achieve in SWIR imaging what CMOS sensors for images, as well as micro-bolometer arrays have achieved for longwave and visible infrared imaging as well as visible infrared imaging. SWIR CQD laser imaging sensors are available in camera-based as well as camera-less variants.

Before making a final decision regarding the detector to use to detect the object, it is important to be aware of each aspect of the process, including how wavelengths respond.

Selecting an optical device for applied pulsed laser beam measurement

Concerning the use of the technology, there’s no one-size-fits all profiler, as different lasers come with different wavelengths. In addition, they have different beam dimensions and power levels, so it is necessary to use different optical equipment. Optical systems must be equipped with wavelength-specific attenuators, as well as antireflective coatings that accurately measure the spectrum. These variations can cause errors in measurements.

Camera-based systems for profiling laser beams are the most common choice when it comes to large-scale beam measurements. They employ an CMOS-based or photodiode-based sensor to determine the wavelength. In fact, camera-based systems are used in many different ways for industrial applications, in research and development, and within military use.

Camera-based systems that use pulsed laser beam profilers provide many advantages over slit-based devices. Slit-based systems permit the measurement of beams with very small diameters directly while camera-based systems analyze both focused and unfocused beams. They are especially useful for factory-floor applications, where accuracy and repeatability are crucial.

Camera-based systems for pulsed laser beam profilers are highly sensitive to artifacts associated with low-linewidth laser beams. The artifacts are eliminated through careful optical design.

The camera-based system is the ideal choice for a wide range of applications.The cameras used to perform pulsed laser beam profiling are typically C-mount compatible. The camera head doesn’t have a faceplate that is in front of the sensor chip therefore there is no need to purchase a separate ND filter (the filters block any light that is not directed towards the sensor chip).

In contrast to conventional laser beam measurements, which require an optical lens that has a fixed aperture to observe a beam Acuros CDQ Sensors can laser beam profile without a camera. Cameras are not always suitable for large-beam applications since it’s not able to take beams with smaller diameters.

Applications

Applications of SWIR Laser Beam Profiling are extremely diverse. These measurements are useful in a myriad of ways, including laser collimation and characterisation. There are many advantages to making use of the CCD beam profiler, such as the ability to measure astigmatism and its ability to translate around the beam’s path. For example an CCD beam profiler can measure the astigmatism of a laser beam that is essential for measuring astigmatism in medical imaging. Additionally the CCD beam profiler can determine astigmatism even without a cover glass. Additionally, the absence of cover glass is an important aspect of beam profilers using CCD. While a CCD camera might not be appropriate for all purposes, it is frequently preferable for SWIR laser beam monitoring, dependent on the task in hand.